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Information card for entry 1552122
Preview
| Coordinates | 1552122.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C75 H175 Ag20 O24 P12 Pd S24 |
|---|---|
| Calculated formula | C75 H175 Ag20 O24 P12 Pd S24 |
| Title of publication | Mono- and hexa-palladium doped silver nanoclusters stabilized by dithiolates. |
| Authors of publication | Barik, Subrat Kumar; Chiu, Tzu-Hao; Liu, Yu-Chiao; Chiang, Ming-Hsi; Gam, Franck; Chantrenne, Isaac; Kahlal, Samia; Saillard, Jean-Yves; Liu, C. W. |
| Journal of publication | Nanoscale |
| Year of publication | 2019 |
| Journal volume | 11 |
| Journal issue | 31 |
| Pages of publication | 14581 - 14586 |
| a | 30.0622 ± 0.0012 Å |
| b | 17.3584 ± 0.0007 Å |
| c | 29.8055 ± 0.0012 Å |
| α | 90° |
| β | 109.487 ± 0.001° |
| γ | 90° |
| Cell volume | 14662.5 ± 1 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.052 |
| Residual factor for significantly intense reflections | 0.0387 |
| Weighted residual factors for significantly intense reflections | 0.0885 |
| Weighted residual factors for all reflections included in the refinement | 0.0979 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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