Information card for entry 1552763
| Formula |
C33 H28 O4 S4 |
| Calculated formula |
C33 H28 O4 S4 |
| SMILES |
c1(ccc(cc1)SC(=O)C)C(c1ccc(cc1)SC(=O)C)(c1ccc(cc1)SC(=O)C)c1ccc(cc1)SC(=O)C |
| Title of publication |
Tuning the contact conductance of anchoring groups in single molecule junctions by molecular design. |
| Authors of publication |
Šebera, Jakub; Lindner, Marcin; Gasior, JindÅ™ich; Mészáros, Gábor; Fuhr, Olaf; Mayor, Marcel; Valášek, Michal; Kolivoška, Viliam; Hromadová, Magdaléna |
| Journal of publication |
Nanoscale |
| Year of publication |
2019 |
| Journal volume |
11 |
| Journal issue |
27 |
| Pages of publication |
12959 - 12964 |
| a |
20.2681 ± 0.0016 Å |
| b |
20.2681 ± 0.0016 Å |
| c |
7.1102 ± 0.0008 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2920.8 ± 0.5 Å3 |
| Cell temperature |
180.15 K |
| Ambient diffraction temperature |
180.15 K |
| Number of distinct elements |
4 |
| Space group number |
88 |
| Hermann-Mauguin space group symbol |
I 41/a :2 |
| Hall space group symbol |
-I 4ad |
| Residual factor for all reflections |
0.0375 |
| Residual factor for significantly intense reflections |
0.0294 |
| Weighted residual factors for significantly intense reflections |
0.0764 |
| Weighted residual factors for all reflections included in the refinement |
0.0796 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.066 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1552763.html