Information card for entry 1552916
| Formula |
C30 H26 |
| Calculated formula |
C30 H26 |
| Title of publication |
Highly Emissive Hierarchical Uniform Dialkylfluorene-Based Dimer Microcrystals for Ultraviolet Organic Laser |
| Authors of publication |
Zhu, Wen-Sai; Han, Ya-Min; An, Xiang; Weng, Jie-Na; Yu, Meng-Na; Bai, Lu-Bing; Wei, Chuan-Xin; Lin, Jin-Yi; Liu, Wei; Ou, Chang-Jin; Xie, Ling-Hai; Ding, Xue-Hua; Zhao, Jian-Feng; Xu, Chun-Xiang; Huang, Wei |
| Journal of publication |
The Journal of Physical Chemistry C |
| Year of publication |
2019 |
| a |
8.39 ± 0.003 Å |
| b |
9.828 ± 0.003 Å |
| c |
13.251 ± 0.004 Å |
| α |
79.129 ± 0.011° |
| β |
87.424 ± 0.007° |
| γ |
89.762 ± 0.007° |
| Cell volume |
1071.9 ± 0.6 Å3 |
| Cell temperature |
293.15 K |
| Ambient diffraction temperature |
293.15 K |
| Number of distinct elements |
2 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.1248 |
| Residual factor for significantly intense reflections |
0.0978 |
| Weighted residual factors for significantly intense reflections |
0.2525 |
| Weighted residual factors for all reflections included in the refinement |
0.2849 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.039 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1552916.html