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Information card for entry 1553639
Preview
| Coordinates | 1553639.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H38 N2 O2 S3 |
|---|---|
| Calculated formula | C32.4 H37.76 N2 O2 S2.908 |
| SMILES | c12C(=S)N(C(=O)c3c1c1c(c4ccsc34)C(=O)N(CCCCCCCC)C(=S)c1cc2)CCCCCCCC |
| Title of publication | Selective thionation of naphtho[2,3-b]thiophene diimide: tuning of the optoelectronic properties and packing structure |
| Authors of publication | Chen, Wangqiao; Nakano, Masahiro; Takimiya, Kazuo; Zhang, Qichun |
| Journal of publication | Organic Chemistry Frontiers |
| Year of publication | 2017 |
| Journal volume | 4 |
| Journal issue | 5 |
| Pages of publication | 704 |
| a | 20.477 ± 0.0009 Å |
| b | 5.2589 ± 0.0002 Å |
| c | 28.0402 ± 0.0012 Å |
| α | 90° |
| β | 101.007 ± 0.0019° |
| γ | 90° |
| Cell volume | 2964 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1155 |
| Residual factor for significantly intense reflections | 0.0889 |
| Weighted residual factors for significantly intense reflections | 0.2224 |
| Weighted residual factors for all reflections included in the refinement | 0.2399 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.277 |
| Diffraction radiation wavelength | 1.54187 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1553639.html
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Users of the data should acknowledge the original authors of the
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