Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1553658
Preview
| Coordinates | 1553658.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C4 H12 N2 O10 Se2 V2 |
|---|---|
| Calculated formula | C4 H12 N2 O10 Se2 V2 |
| Title of publication | Understanding structural adaptability: a reactant informatics approach to experiment design |
| Authors of publication | Xu, Rosalind J.; Olshansky, Jacob H.; Adler, Philip D. F.; Huang, Yongjia; Smith, Matthew D.; Zeller, Matthias; Schrier, Joshua; Norquist, Alexander J. |
| Journal of publication | Molecular Systems Design & Engineering |
| Year of publication | 2018 |
| Journal volume | 3 |
| Journal issue | 3 |
| Pages of publication | 473 |
| a | 10.0879 ± 0.0004 Å |
| b | 6.2047 ± 0.0002 Å |
| c | 10.6765 ± 0.0004 Å |
| α | 90° |
| β | 116.566 ± 0.0017° |
| γ | 90° |
| Cell volume | 597.71 ± 0.04 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.021 |
| Residual factor for significantly intense reflections | 0.019 |
| Weighted residual factors for all reflections | 0.053 |
| Weighted residual factors for significantly intense reflections | 0.0521 |
| Weighted residual factors for all reflections included in the refinement | 0.053 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0045 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1553658.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.