Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1553666
Preview
| Coordinates | 1553666.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H14 Hg I2 N2 S2 |
|---|---|
| Calculated formula | C20 H14 Hg I2 N2 S2 |
| SMILES | C1(=C(c2cccs2)c2cccs2)c2cccc[n]2[Hg](I)(I)[n]2c1cccc2 |
| Title of publication | A turn-on AIE active fluorescent sensor for Hg2+ by combination of 1,1-bis(2-pyridyl)ethylene and thiophene/bithiophene fragments |
| Authors of publication | Gabr, Moustafa T.; Christopher Pigge, F. |
| Journal of publication | Materials Chemistry Frontiers |
| Year of publication | 2017 |
| Journal volume | 1 |
| Journal issue | 8 |
| Pages of publication | 1654 |
| a | 10.2226 ± 0.001 Å |
| b | 10.3008 ± 0.001 Å |
| c | 12.2126 ± 0.0012 Å |
| α | 74.477 ± 0.005° |
| β | 67.707 ± 0.005° |
| γ | 71.185 ± 0.005° |
| Cell volume | 1110.69 ± 0.19 Å3 |
| Cell temperature | 190 ± 2 K |
| Ambient diffraction temperature | 190.15 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0275 |
| Residual factor for significantly intense reflections | 0.0211 |
| Weighted residual factors for significantly intense reflections | 0.0429 |
| Weighted residual factors for all reflections included in the refinement | 0.0478 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.155 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1553666.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.