Information card for entry 1554065
| Chemical name |
9,10-Diphenylanthracene |
| Formula |
C26 H18 |
| Calculated formula |
C26 H18 |
| Title of publication |
Two New Polymorphs of the Organic Semiconductor 9,10-Diphenylanthracene: Raman and X-ray Analysis |
| Authors of publication |
Salzillo, Tommaso; Della Valle, Raffaele Guido; Venuti, Elisabetta; Brillante, Aldo; Siegrist, Theo; Masino, Matteo; Mezzadri, Francesco; Girlando, Alberto |
| Journal of publication |
The Journal of Physical Chemistry C |
| Year of publication |
2016 |
| Journal volume |
120 |
| Journal issue |
3 |
| Pages of publication |
1831 |
| a |
9.4976 ± 0.001 Å |
| b |
20.413 ± 0.002 Å |
| c |
10.0843 ± 0.0009 Å |
| α |
90° |
| β |
112.307 ± 0.009° |
| γ |
90° |
| Cell volume |
1808.8 ± 0.3 Å3 |
| Cell temperature |
293 K |
| Ambient diffraction temperature |
293 K |
| Number of distinct elements |
2 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/a 1 |
| Hall space group symbol |
-P 2yab |
| Residual factor for all reflections |
0.1273 |
| Residual factor for significantly intense reflections |
0.0478 |
| Weighted residual factors for all reflections |
0.0577 |
| Weighted residual factors for significantly intense reflections |
0.0457 |
| Weighted residual factors for all reflections included in the refinement |
0.0457 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.9513 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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