Information card for entry 1554567
| Formula |
C22 H24 O7 |
| Calculated formula |
C22 H24 O7 |
| SMILES |
O1[C@H](C(Oc2c3c(C(=O)c4c(O[C@]13CC)cccc4O)c(O)cc2C)(C)C)CO.O1[C@@H](C(Oc2c3c(C(=O)c4c(O[C@@]13CC)cccc4O)c(O)cc2C)(C)C)CO |
| Title of publication |
Cytorhizophins A and B, benzophenone-hemiterpene adducts from the endophytic fungus Cytospora rhizophorae |
| Authors of publication |
Liu, Hongxin; Tan, Haibo; Wang, Wenxuan; Zhang, Wenge; Chen, Yuchan; Li, Saini; Liu, Zhaoming; Li, Haohua; Zhang, Weimin |
| Journal of publication |
Organic Chemistry Frontiers |
| Year of publication |
2019 |
| Journal volume |
6 |
| Journal issue |
5 |
| Pages of publication |
591 |
| a |
9.1375 ± 0.0001 Å |
| b |
13.1527 ± 0.0002 Å |
| c |
16.354 ± 0.0003 Å |
| α |
95.187 ± 0.001° |
| β |
95.294 ± 0.001° |
| γ |
103.04 ± 0.001° |
| Cell volume |
1894.04 ± 0.05 Å3 |
| Cell temperature |
100 ± 0.18 K |
| Ambient diffraction temperature |
100 ± 0.18 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0398 |
| Residual factor for significantly intense reflections |
0.0375 |
| Weighted residual factors for significantly intense reflections |
0.0984 |
| Weighted residual factors for all reflections included in the refinement |
0.1009 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.049 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1554567.html