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Information card for entry 1556704
Preview
| Coordinates | 1556704.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 N4 O8 S3 |
|---|---|
| Calculated formula | C37 N4 O8 S3 |
| SMILES | s1c2c3sc4c5c6c(C(=O)N(C)C5=O)ccc5c6c(c4c3sc2c2c1c1c3c(C(=O)N(C1=O)C)ccc1c3c2C(=O)N(C)C1=O)C(=O)N(C5=O)CC |
| Title of publication | Trisulfur radical anion-triggered stitching thienannulation: rapid access to largely π-extended thienoacenes |
| Authors of publication | Su, Feng; Chen, Shuqi; Mo, Xiaogang; Wu, Kongchuan; Wu, Jiajun; Lin, Weidong; Lin, Zhiwei; Lin, Jianbin; Zhang, Hui-Jun; Wen, Ting-Bin |
| Journal of publication | Chemical Science |
| Year of publication | 2020 |
| Journal volume | 11 |
| Journal issue | 6 |
| Pages of publication | 1503 - 1509 |
| a | 22.0328 ± 0.001 Å |
| b | 21.2168 ± 0.0007 Å |
| c | 33.589 ± 0.003 Å |
| α | 90° |
| β | 102.198 ± 0.005° |
| γ | 90° |
| Cell volume | 15347.2 ± 1.6 Å3 |
| Cell temperature | 100 ± 0.11 K |
| Ambient diffraction temperature | 100 ± 0.11 K |
| Number of distinct elements | 4 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.2265 |
| Residual factor for significantly intense reflections | 0.1541 |
| Weighted residual factors for significantly intense reflections | 0.3571 |
| Weighted residual factors for all reflections included in the refinement | 0.407 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1556704.html
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Users of the data should acknowledge the original authors of the
structural data.