Information card for entry 1557074

Structure parameters

• Formula: C44 H36 Hf N8
• Calculated formula: C44 Hf N8
• SMILES: c12cccc[n]1[Hf]134(N2c2ccccc2)([n]2c(N1c1ccccc1)cccc2)([n]1c(cccc1)N3c1ccccc1)[n]1c(cccc1)N4c1ccccc1
• Title of publication: Synthesis and Crystal Structure of an 8-Coordinated Tetrakis[2-(phenylamido)pyridine]hafnium(IV) and Comparison with a 4-Coordinated Tetrakis(diphenylamido)hafnium(IV)
• Authors of publication: Polamo, Mika; Leskela, Markku
• Journal of publication: Acta Chemica Scandinavica
• Year of publication: 1997
• Journal volume: 51
• Pages of publication: 69 - 72
• a: 24.213 ± 0.011 Å
• b: 7.916 ± 0.008 Å
• c: 20.432 ± 0.009 Å
• α: 90°
• β: 112.01 ± 0.03°
• γ: 90°
• Cell volume: 3631 ± 4 ų
• Ambient diffraction temperature: 193 K
• Number of distinct elements: 4
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0893
• Residual factor for significantly intense reflections: 0.0878
• Weighted residual factors for significantly intense reflections: 0.2417
• Weighted residual factors for all reflections included in the refinement: 0.2442
• Goodness-of-fit parameter for all reflections included in the refinement: 1.153
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No