Information card for entry 1557450

Structure parameters

• Formula: C59 H80 Cl15 Ga3 N3 P
• Calculated formula: C59 H80 Cl15 Ga3 N3 P
• SMILES: [Ga](Cl)(Cl)(Cl)[Cl][Ga](Cl)(Cl)Cl.[Ga](Cl)(Cl)([Cl-])Cl.ClCCl.ClCCl.P(=C(c1n(cc[n+]1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)c1ccccc1)C1=[N+](C(CC21CCCCC2)(C)C)c1c(cccc1C(C)C)C(C)C
• Title of publication: Isolation of singlet carbene derived 2-phospha-1,3-butadienes and their sequential one-electron oxidation to radical cations and dications
• Authors of publication: Sharma, Mahendra K.; Blomeyer, Sebastian; Glodde, Timo; Neumann, Beate; Stammler, Hans-Georg; Hinz, Alexander; van Gastel, Maurice; Ghadwal, Rajendra S.
• Journal of publication: Chemical Science
• Year of publication: 2020
• Journal volume: 11
• Journal issue: 7
• Pages of publication: 1975 - 1984
• a: 19.16275 ± 0.00015 Å
• b: 13.46701 ± 0.0001 Å
• c: 28.2924 ± 0.0002 Å
• α: 90°
• β: 94.584 ± 0.0007°
• γ: 90°
• Cell volume: 7277.92 ± 0.09 ų
• Cell temperature: 100 ± 0.1 K
• Ambient diffraction temperature: 100 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0384
• Residual factor for significantly intense reflections: 0.036
• Weighted residual factors for significantly intense reflections: 0.0954
• Weighted residual factors for all reflections included in the refinement: 0.0974
• Goodness-of-fit parameter for all reflections included in the refinement: 1.034
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No