Information card for entry 1559211
| Chemical name |
2,2-Bis[3,5-bis(dimethylamino)phenyl]-1,1,1,3,3,3-hexamethyltrisilane |
| Formula |
C26 H48 N4 Si3 |
| Calculated formula |
C26 H48 N4 Si3 |
| SMILES |
[Si]([Si]([Si](C)(C)C)(c1cc(cc(c1)N(C)C)N(C)C)c1cc(cc(c1)N(C)C)N(C)C)(C)(C)C |
| Title of publication |
2,2-Bis[3,5-bis(dimethylamino)phenyl]-1,1,1,3,3,3-hexamethyltrisilane |
| Authors of publication |
Mizuhata, Yoshiyuki; Iwai, Kento; Tokitoh, Norihiro |
| Journal of publication |
IUCrData |
| Year of publication |
2020 |
| Journal volume |
5 |
| Journal issue |
9 |
| Pages of publication |
x201299 |
| a |
20.6543 ± 0.0003 Å |
| b |
8.365 ± 0.0001 Å |
| c |
17.5215 ± 0.0003 Å |
| α |
90° |
| β |
97.371 ± 0.002° |
| γ |
90° |
| Cell volume |
3002.23 ± 0.08 Å3 |
| Cell temperature |
103 ± 2 K |
| Ambient diffraction temperature |
103 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0397 |
| Residual factor for significantly intense reflections |
0.0325 |
| Weighted residual factors for significantly intense reflections |
0.0817 |
| Weighted residual factors for all reflections included in the refinement |
0.0863 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.038 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/1559211.html