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Information card for entry 1559462
Preview
| Coordinates | 1559462.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [Pt(C4H8OS)4](CF3SO3)2.H2O |
|---|---|
| Formula | C18 H34 F6 O11 Pt S6 |
| Calculated formula | C18 F6 O12 Pt S6 |
| SMILES | C(S(=O)(=O)[O-])(F)(F)F.[Pt]([S]1CCOCC1)([S]1CCOCC1)([S]1CCOCC1)[S]1CCOCC1.O.O.C(S(=O)(=O)[O-])(F)(F)F |
| Title of publication | cis- and trans-Influence on Bond Distances. Synthesis and Crystal Structures of the Bis(trifluoromethanesulfonates) of Tetrakis(dimethyl sulfide)- and Tetrakis(1,4-thioxane)platinum(II) |
| Authors of publication | Bugarcic, Zivadin; Noren, Bertil; Oskarsson, Ake; Stalhandske, Claes; Elding, Lars I. |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1991 |
| Journal volume | 45 |
| Pages of publication | 361 - 366 |
| a | 14.438 ± 0.002 Å |
| b | 13.016 ± 0.002 Å |
| c | 21.696 ± 0.003 Å |
| α | 90° |
| β | 126.32 ± 0.01° |
| γ | 90° |
| Cell volume | 3285.1 ± 0.9 Å3 |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for significantly intense reflections | 0.035 |
| Weighted residual factors for significantly intense reflections | 0.05 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.84 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1559462.html
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Users of the data should acknowledge the original authors of the
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