Information card for entry 1559661

Structure parameters

• Common name: 4-Ethoxyphenyltellurenyl Methylxanthate
• Formula: C10 H13 O2 S2 Te
• Calculated formula: C10 O2 S2 Te
• SMILES: [Te](SC(=S)OC)c1ccc(OCC)cc1
• Title of publication: The Crystal and Molecular Structure of 4-Ethoxyphenyltellurenyl Methylxanthate, C2H5OPhTeSC(S)OCH3, 4-Ethoxyphenyltellurenyl Dimethyldithiophosphate, C2H5OPhTeSP(S)(OCH3)2, and Ethylenethiourea[N,N-bis(dimethylene)oxide-N'- phenylthiourea]phenyltellurium(II) Bromide, [PhTe(etu)SC(NHPh)N(CH2)4O]Br
• Authors of publication: Husebye, Steinar; Maartmann-Moe, Knut; Mikalsen, Oyvind
• Journal of publication: Acta Chemica Scandinavica
• Year of publication: 1990
• Journal volume: 44
• Pages of publication: 464 - 469
• a: 8.0775 ± 0.0005 Å
• b: 9.3474 ± 0.001 Å
• c: 9.9221 ± 0.001 Å
• α: 65.724 ± 0.008°
• β: 73.501 ± 0.007°
• γ: 78.318 ± 0.007°
• Cell volume: 651.64 ± 0.11 ų
• Ambient diffraction temperature: 293 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for significantly intense reflections: 0.034
• Weighted residual factors for significantly intense reflections: 0.03
• Goodness-of-fit parameter for all reflections included in the refinement: 1.491
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No