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Information card for entry 1559986
Preview
| Coordinates | 1559986.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [(NNTBS)Yb(THF)]2 |
|---|---|
| Formula | C52 H92 Fe2 N4 O2 Si4 Yb2 |
| Calculated formula | C52 H92 Fe2 N4 O2 Si4 Yb2 |
| Title of publication | Distinct electronic structures and bonding interactions in inverse-sandwich samarium and ytterbium biphenyl complexes. |
| Authors of publication | Xiao, Yuyuan; Zhao, Xiao-Kun; Wu, Tianpin; Miller, Jeffrey T.; Hu, Han-Shi; Li, Jun; Huang, Wenliang; Diaconescu, Paula L. |
| Journal of publication | Chemical science |
| Year of publication | 2020 |
| Journal volume | 12 |
| Journal issue | 1 |
| Pages of publication | 227 - 238 |
| a | 11.5553 ± 0.0005 Å |
| b | 12.3812 ± 0.0006 Å |
| c | 12.4512 ± 0.0006 Å |
| α | 112.215 ± 0.005° |
| β | 96.684 ± 0.004° |
| γ | 113.262 ± 0.004° |
| Cell volume | 1439.25 ± 0.16 Å3 |
| Cell temperature | 179.99 ± 0.1 K |
| Ambient diffraction temperature | 179.99 ± 0.1 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0845 |
| Residual factor for significantly intense reflections | 0.0752 |
| Weighted residual factors for significantly intense reflections | 0.1838 |
| Weighted residual factors for all reflections included in the refinement | 0.1914 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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