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Information card for entry 1560399
Preview
| Coordinates | 1560399.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cu4 S4 Sn |
|---|---|
| Calculated formula | Cu4 S4 Sn |
| Title of publication | New insights into the structure, chemistry, and properties of Cu4SnS4 |
| Authors of publication | Choudhury, Amitava; Mohapatra, Sudip; Yaghoobnejad Asl, Hooman; Lee, Seng Huat; Hor, Yew San; Medvedeva, Julia E.; McClane, Devon L.; Hilmas, Gregory E.; McGuire, Michael A.; May, Andrew F.; Wang, Hsin; Dash, Shreeram; Welton, Aaron; Boolchand, Punit; Devlin, Kasey P.; Aitken, Jennifer; Herbst-Irmer, Regine; Petříček, Váčlav |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2017 |
| Journal volume | 253 |
| Pages of publication | 192 - 201 |
| a | 10.058 ± 0.006 Å |
| b | 13.489 ± 0.008 Å |
| c | 10.085 ± 0.006 Å |
| α | 90° |
| β | 100.84 ± 0.007° |
| γ | 90° |
| Cell volume | 1343.8 ± 1.4 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1149 |
| Residual factor for significantly intense reflections | 0.0672 |
| Weighted residual factors for significantly intense reflections | 0.1277 |
| Weighted residual factors for all reflections included in the refinement | 0.1461 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.967 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1560399.html
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