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Information card for entry 1561191
Preview
| Coordinates | 1561191.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C81 H170 K2 N2 O26 Si6 U2 |
|---|---|
| Calculated formula | C81 H170 K2 N2 O26 Si6 U2 |
| Title of publication | Single metal four-electron reduction by U(ii) and masked "U(ii)" compounds. |
| Authors of publication | Modder, Dieuwertje K.; Palumbo, Chad T.; Douair, Iskander; Scopelliti, Rosario; Maron, Laurent; Mazzanti, Marinella |
| Journal of publication | Chemical science |
| Year of publication | 2021 |
| Journal volume | 12 |
| Journal issue | 17 |
| Pages of publication | 6153 - 6158 |
| a | 13.9927 ± 0.0015 Å |
| b | 18.2874 ± 0.0012 Å |
| c | 22.208 ± 0.002 Å |
| α | 90° |
| β | 93.321 ± 0.007° |
| γ | 90° |
| Cell volume | 5673.3 ± 0.9 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0717 |
| Residual factor for significantly intense reflections | 0.0511 |
| Weighted residual factors for significantly intense reflections | 0.1029 |
| Weighted residual factors for all reflections included in the refinement | 0.1128 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1561191.html
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