Information card for entry 1562353
| Formula |
C62.5 H75 Cl N4 |
| Calculated formula |
C62.5 H75 Cl N4 |
| SMILES |
ClCCl.N(c1ccc(cc1)/C(=C(/c1ccc(N(c2ccc(cc2)C(C)(C)C)c2ccc(cc2)C(C)(C)C)cc1)C#N)C#N)(c1ccc(C(C)(C)C)cc1)c1ccc(C(C)(C)C)cc1.C(CCCC)C |
| Title of publication |
Organic Nanoparticles-Assisted Low-Power STED Nanoscopy. |
| Authors of publication |
Man, Zhongwei; Cui, Hongtu; Lv, Zheng; Xu, Zhenzhen; Wu, Zhaoyang; Wu, Yishi; Liao, Qing; Liu, Meihui; Xi, Peng; Zheng, Lemin; Fu, Hongbing |
| Journal of publication |
Nano letters |
| Year of publication |
2021 |
| Journal volume |
21 |
| Journal issue |
8 |
| Pages of publication |
3487 - 3494 |
| a |
14.5082 ± 0.0004 Å |
| b |
20.329 ± 0.0006 Å |
| c |
37.5089 ± 0.0012 Å |
| α |
90° |
| β |
97.29 ± 0.004° |
| γ |
90° |
| Cell volume |
10973.3 ± 0.6 Å3 |
| Cell temperature |
100 ± 0.1 K |
| Ambient diffraction temperature |
100 ± 0.1 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1158 |
| Residual factor for significantly intense reflections |
0.0932 |
| Weighted residual factors for significantly intense reflections |
0.2633 |
| Weighted residual factors for all reflections included in the refinement |
0.2919 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.049 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1562353.html