Information card for entry 1563141

Structure parameters

• Formula: C50 H100 K N5 O6 Si6 U
• Calculated formula: C50 H100 K N5 O6 Si6 U
• SMILES: [U]1(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[C](#[C]1c1ccccc1)c1ccccc1.[K]1234567[O]8CC[N]96CC[O]3CC[O]2CC[N]7(CC[O]1CC8)CC[O]5CC[O]4CC9
• Title of publication: Single metal four-electron reduction by U(ii) and masked "U(ii)" compounds.
• Authors of publication: Modder, Dieuwertje K.; Palumbo, Chad T.; Douair, Iskander; Scopelliti, Rosario; Maron, Laurent; Mazzanti, Marinella
• Journal of publication: Chemical science
• Year of publication: 2021
• Journal volume: 12
• Journal issue: 17
• Pages of publication: 6153 - 6158
• a: 15.66789 ± 0.00014 Å
• b: 17.47136 ± 0.00016 Å
• c: 24.16489 ± 0.00019 Å
• α: 90°
• β: 93.6596 ± 0.0008°
• γ: 90°
• Cell volume: 6601.39 ± 0.1 ų
• Cell temperature: 140 ± 0.1 K
• Ambient diffraction temperature: 140 ± 0.1 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0306
• Residual factor for significantly intense reflections: 0.0273
• Weighted residual factors for significantly intense reflections: 0.0648
• Weighted residual factors for all reflections included in the refinement: 0.0665
• Goodness-of-fit parameter for all reflections included in the refinement: 1.04
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No