Information card for entry 1563143

Structure parameters

• Formula: C48 H100 K N7 O6 Si6 U
• Calculated formula: C48 H100 K N7 O6 Si6 U
• SMILES: [U]1(N([Si](C)(C)C)[Si](C)(C)C)([N](=[N]1c1ccccc1)c1ccccc1)([N]([Si](C)(C)C)[Si](C)(C)C)[N]([Si](C)(C)C)[Si](C)(C)C.[K]1234567[O]8CC[N]96CC[O]2CC[O]3CC[N]7(CC[O]1CC8)CC[O]5CC[O]4CC9
• Title of publication: Single metal four-electron reduction by U(ii) and masked "U(ii)" compounds.
• Authors of publication: Modder, Dieuwertje K.; Palumbo, Chad T.; Douair, Iskander; Scopelliti, Rosario; Maron, Laurent; Mazzanti, Marinella
• Journal of publication: Chemical science
• Year of publication: 2021
• Journal volume: 12
• Journal issue: 17
• Pages of publication: 6153 - 6158
• a: 11.477 ± 0.0003 Å
• b: 16.679 ± 0.0008 Å
• c: 19.0067 ± 0.0008 Å
• α: 103.478 ± 0.004°
• β: 101.463 ± 0.003°
• γ: 90.908 ± 0.003°
• Cell volume: 3460.2 ± 0.2 ų
• Cell temperature: 140 ± 0.1 K
• Ambient diffraction temperature: 140 ± 0.1 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1104
• Residual factor for significantly intense reflections: 0.1069
• Weighted residual factors for significantly intense reflections: 0.2799
• Weighted residual factors for all reflections included in the refinement: 0.2818
• Goodness-of-fit parameter for all reflections included in the refinement: 1.147
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No