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Information card for entry 1564536
Preview
| Coordinates | 1564536.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H24 Cl2 Rh2 |
|---|---|
| Calculated formula | C16 H24 Cl2 Rh2 |
| SMILES | [Rh]1234([Cl][Rh]567([Cl]1)[CH]1=[CH]7CC[CH]6=[CH]5CC1)[CH]1=[CH]2CC[CH]3=[CH]4CC1 |
| Title of publication | Structural and Electronic Effects of X-ray Irradiation on Prototypical [M(COD)Cl]<sub>2</sub> Catalysts. |
| Authors of publication | Fernando, Nathalie K.; Cairns, Andrew B.; Murray, Claire A.; Thompson, Amber L.; Dickerson, Joshua L.; Garman, Elspeth F.; Ahmed, Nayera; Ratcliff, Laura E.; Regoutz, Anna |
| Journal of publication | The journal of physical chemistry. A |
| Year of publication | 2021 |
| Journal volume | 125 |
| Journal issue | 34 |
| Pages of publication | 7473 - 7488 |
| a | 7.29534 ± 0.00006 Å |
| b | 25.43886 ± 0.00017 Å |
| c | 9.04309 ± 0.00006 Å |
| α | 90° |
| β | 91.8695 ± 0.0006° |
| γ | 90° |
| Cell volume | 1677.37 ± 0.02 Å3 |
| Cell temperature | 300 ± 0.1 K |
| Ambient diffraction temperature | 300 ± 0.1 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0486 |
| Residual factor for significantly intense reflections | 0.0457 |
| Weighted residual factors for significantly intense reflections | 0.1435 |
| Weighted residual factors for all reflections included in the refinement | 0.1487 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.1737 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.6889 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1564536.html
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Users of the data should acknowledge the original authors of the
structural data.