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Information card for entry 1565386
Preview
| Coordinates | 1565386.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Al2.69 B50 |
|---|---|
| Calculated formula | Al2.686 B50 |
| Title of publication | The discovery of a superhard P-type transparent semiconductor: Al<sub>2.69</sub>B<sub>50</sub>. |
| Authors of publication | Zheng, Xu; Yan, Dayu; Yi, Changjiang; Zhu, Jinlong; Zhang, Qinghua; Zhai, Junyi; Ma, Teng; Zhu, Pinwen; Li, Hui; Gu, Lin; Zhao, Yusheng; Yao, Yugui; Shi, Youguo; Yu, Xiaohui; Jin, Changqing |
| Journal of publication | Materials horizons |
| Year of publication | 2022 |
| Journal volume | 9 |
| Journal issue | 2 |
| Pages of publication | 748 - 755 |
| a | 12.661 ± 0.003 Å |
| b | 12.337 ± 0.002 Å |
| c | 5.0928 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 795.5 ± 0.3 Å3 |
| Cell temperature | 655 ± 2 K |
| Ambient diffraction temperature | 655 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 67 |
| Hermann-Mauguin space group symbol | C m m a |
| Hall space group symbol | -C 2a 2 |
| Residual factor for all reflections | 0.0667 |
| Residual factor for significantly intense reflections | 0.0555 |
| Weighted residual factors for significantly intense reflections | 0.1538 |
| Weighted residual factors for all reflections included in the refinement | 0.1633 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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