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Information card for entry 1565580
Preview
| Coordinates | 1565580.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33 H23 N4 O P |
|---|---|
| Calculated formula | C33 H23 N4 O P |
| SMILES | P(=O)(c1ccccc1)(c1nc(nc(n1)n1c2c(c3c1cccc3)cccc2)c1ccccc1)c1ccccc1 |
| Title of publication | High-efficiency hyperfluorescent white light-emitting diodes based on high-concentration-doped TADF sensitizer matrices <i>via</i> spatial and energy gap effects. |
| Authors of publication | Duan, Chunbo; Xin, Ying; Wang, Zicheng; Zhang, Jing; Han, Chunmiao; Xu, Hui |
| Journal of publication | Chemical science |
| Year of publication | 2021 |
| Journal volume | 13 |
| Journal issue | 1 |
| Pages of publication | 159 - 169 |
| a | 8.265 ± 0.005 Å |
| b | 23.677 ± 0.005 Å |
| c | 26.571 ± 0.005 Å |
| α | 90 ± 0.005° |
| β | 90 ± 0.005° |
| γ | 90 ± 0.005° |
| Cell volume | 5200 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.1622 |
| Residual factor for significantly intense reflections | 0.0721 |
| Weighted residual factors for significantly intense reflections | 0.1657 |
| Weighted residual factors for all reflections included in the refinement | 0.2307 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1565580.html
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Users of the data should acknowledge the original authors of the
structural data.