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Information card for entry 1565664
Preview
| Coordinates | 1565664.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H68 B O2 Si2 Sm |
|---|---|
| Calculated formula | C34 H68 B O2 Si2 Sm |
| SMILES | [Sm]123456789([H][BH]([H]1)[H]2)([O]1CCCC1)([O]1CCCC1)[C]1([Si](C(C)C)(C(C)C)C(C)C)=[CH]3[CH]4=[CH]5[CH]6=[C]7([Si](C(C)C)(C(C)C)C(C)C)[CH]8=[CH]91 |
| Title of publication | Introduction of plumbole to f-element chemistry |
| Authors of publication | Münzfeld, Luca; Sun, Xiaofei; Schlittenhardt, Sören; Schoo, Christoph; Hauser, Adrian; Gillhuber, Sebastian; Weigend, Florian; Ruben, Mario; Roesky, Peter W. |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| Journal volume | 13 |
| Journal issue | 4 |
| Pages of publication | 945 - 954 |
| a | 7.5051 ± 0.0003 Å |
| b | 26.3267 ± 0.0009 Å |
| c | 19.4417 ± 0.0008 Å |
| α | 90° |
| β | 98.004 ± 0.003° |
| γ | 90° |
| Cell volume | 3804 ± 0.3 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0622 |
| Residual factor for significantly intense reflections | 0.051 |
| Weighted residual factors for significantly intense reflections | 0.1335 |
| Weighted residual factors for all reflections included in the refinement | 0.138 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1565664.html
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Users of the data should acknowledge the original authors of the
structural data.