Information card for entry 1565666

Structure parameters

• Formula: C65 H104 Li O Pb Si4 Sm
• Calculated formula: C65 H104 Li O Pb Si4 Sm
• SMILES: [Pb]1[C]23([Sm]456789%10%11%12([C]%131([Si](C)(C)C(C)(C)C)[C]14([C]25(c2ccccc2)[Li]3%131[O]1CCCC1)c1ccccc1)[C]1([Si](C(C)C)(C(C)C)C(C)C)=[CH]6[CH]7=[C]8([CH]9=[CH]%10[CH]%11=[CH]%121)[Si](C(C)C)(C(C)C)C(C)C)[Si](C)(C)C(C)(C)C.Cc1ccccc1
• Title of publication: Introduction of plumbole to f-element chemistry
• Authors of publication: Münzfeld, Luca; Sun, Xiaofei; Schlittenhardt, Sören; Schoo, Christoph; Hauser, Adrian; Gillhuber, Sebastian; Weigend, Florian; Ruben, Mario; Roesky, Peter W.
• Journal of publication: Chemical Science
• Year of publication: 2022
• Journal volume: 13
• Journal issue: 4
• Pages of publication: 945 - 954
• a: 13.5678 ± 0.0008 Å
• b: 13.7727 ± 0.0005 Å
• c: 35.796 ± 0.002 Å
• α: 90°
• β: 93.725 ± 0.005°
• γ: 90°
• Cell volume: 6674.9 ± 0.6 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0362
• Residual factor for significantly intense reflections: 0.0296
• Weighted residual factors for significantly intense reflections: 0.0728
• Weighted residual factors for all reflections included in the refinement: 0.0746
• Goodness-of-fit parameter for all reflections included in the refinement: 0.997
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No