Information card for entry 1566374
| Common name |
Bis[1,2-bis(4-chlorophenyl)ethylene-1,2-dithiolato(1-)]nickel(II) |
| Chemical name |
Bis[1,2-bis(4-chlorophenyl)-2-sulfanylideneethane-1-thiolato]nickel(II) |
| Formula |
C28 H16 Cl4 Ni S4 |
| Calculated formula |
C28 H16 Cl4 Ni S4 |
| SMILES |
[Ni]12(SC(=C(S2)c2ccc(Cl)cc2)c2ccc(Cl)cc2)SC(=C(S1)c1ccc(Cl)cc1)c1ccc(Cl)cc1 |
| Title of publication |
Bis[1,2-bis(4-chlorophenyl)ethylene-1,2-dithiolato(1–)]nickel(II) |
| Authors of publication |
Koehne, Sydney; Mirmelli, Bailey; Mague, Joel T.; Donahue, James P. |
| Journal of publication |
IUCrData |
| Year of publication |
2022 |
| Journal volume |
7 |
| Journal issue |
2 |
| Pages of publication |
x220148 |
| a |
9.5487 ± 0.0004 Å |
| b |
11.4141 ± 0.0004 Å |
| c |
15.0254 ± 0.0006 Å |
| α |
107.486 ± 0.002° |
| β |
94.791 ± 0.002° |
| γ |
111.423 ± 0.002° |
| Cell volume |
1419.16 ± 0.1 Å3 |
| Cell temperature |
170 ± 2 K |
| Ambient diffraction temperature |
170 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0625 |
| Residual factor for significantly intense reflections |
0.0404 |
| Weighted residual factors for significantly intense reflections |
0.0976 |
| Weighted residual factors for all reflections included in the refinement |
0.112 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.026 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/1566374.html