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Information card for entry 1566614
Preview
| Coordinates | 1566614.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C66 H72 N4 Ni Si4 |
|---|---|
| Calculated formula | C66 H72 N4 Ni Si4 |
| SMILES | [Ni]1([Si]([Si]([Si]([Si]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(=C1N(C(=C(N1C)CC)CC)C)=C1N(C(=C(N1C)CC)CC)C |
| Title of publication | Metalation-Induced Denitrogenative Reductive Coupling of Isocyanides on a Silylene-Bridged Nickel Cluster |
| Authors of publication | Shimamoto, Kento; Sunada, Yusuke |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| a | 11.7807 ± 0.0004 Å |
| b | 11.8079 ± 0.0003 Å |
| c | 22.9033 ± 0.0007 Å |
| α | 80.502 ± 0.002° |
| β | 78.053 ± 0.003° |
| γ | 71.215 ± 0.003° |
| Cell volume | 2934.25 ± 0.16 Å3 |
| Cell temperature | 113 K |
| Ambient diffraction temperature | 113 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0824 |
| Residual factor for significantly intense reflections | 0.0567 |
| Weighted residual factors for significantly intense reflections | 0.1366 |
| Weighted residual factors for all reflections included in the refinement | 0.1504 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1566614.html
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Users of the data should acknowledge the original authors of the
structural data.