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Information card for entry 1566760
Preview
| Coordinates | 1566760.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C151 H250 Al4 K4 N8 O4 S4 Si8 |
|---|---|
| Calculated formula | C112 H184 Al4 K4 N8 O4 S4 Si8 |
| SMILES | [K+].[S-][Al]1N([Si](O[Si](N1c1c(cccc1C(C)C)C(C)C)(C)C)(C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Carbon–chalcogen bond formation initiated by [Al(NONDipp)(E)]− anions containing Al–E{16} (E{16} = S, Se) multiple bonds |
| Authors of publication | Evans, Matthew J.; Anker, Mathew D.; McMullin, Claire L.; Neale, Samuel E.; Rajabi, Nasir A.; Coles, Martyn P. |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| a | 25.01159 ± 0.00015 Å |
| b | 19.41543 ± 0.00012 Å |
| c | 33.7313 ± 0.0002 Å |
| α | 90° |
| β | 100.884 ± 0.0006° |
| γ | 90° |
| Cell volume | 16085.6 ± 0.17 Å3 |
| Cell temperature | 119.99 ± 0.1 K |
| Ambient diffraction temperature | 119.99 ± 0.1 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0485 |
| Residual factor for significantly intense reflections | 0.0386 |
| Weighted residual factors for significantly intense reflections | 0.1063 |
| Weighted residual factors for all reflections included in the refinement | 0.1123 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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