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Information card for entry 1567005
Preview
| Coordinates | 1567005.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H16 B Cu F6 N4 |
|---|---|
| Calculated formula | C22 H16 B Cu F6 N4 |
| SMILES | [Cu]12([n]3n(ccc3C(F)(F)F)[B](n3[n]1c(cc3)C(F)(F)F)(c1ccccc1)c1ccccc1)[CH]#[CH]2 |
| Title of publication | Isolable acetylene complexes of copper and silver |
| Authors of publication | Noonikara-Poyil, Anurag; Ridlen, Shawn G.; Fernández, Israel; Dias, H. V. Rasika |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| Journal volume | 13 |
| Journal issue | 24 |
| Pages of publication | 7190 - 7203 |
| a | 10.1272 ± 0.0002 Å |
| b | 10.3873 ± 0.0002 Å |
| c | 12.0427 ± 0.0003 Å |
| α | 75.542 ± 0.001° |
| β | 65.639 ± 0.001° |
| γ | 76.936 ± 0.001° |
| Cell volume | 1106.56 ± 0.04 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0373 |
| Residual factor for significantly intense reflections | 0.0331 |
| Weighted residual factors for significantly intense reflections | 0.0824 |
| Weighted residual factors for all reflections included in the refinement | 0.0857 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1567005.html
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