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Information card for entry 1567523
Preview
| Coordinates | 1567523.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C68 H72 P4 Rh2 |
|---|---|
| Calculated formula | C68 H72 P4 Rh2 |
| SMILES | [Rh]1([Rh]2[P@@]3([C@@H](CC[C@H]3c3ccccc3)c3ccccc3)CC[P@]32[C@H](c2ccccc2)CC[C@H]3c2ccccc2)[P@]2([C@@H](CC[C@H]2c2ccccc2)c2ccccc2)CC[P@]21[C@@H](CC[C@H]2c1ccccc1)c1ccccc1 |
| Title of publication | Direct Method to Access Various Functional Arylalkoxysilanes by Rh-catalysed Intermolecular C–H Silylation of Alkoxysilane |
| Authors of publication | Som, Salina; Choi, Jongwook; Katsoulis, Dimitris; Lee, Kangsang L. |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| a | 13.1998 ± 0.0004 Å |
| b | 18.0969 ± 0.0005 Å |
| c | 24.5076 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5854.3 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0841 |
| Residual factor for significantly intense reflections | 0.0427 |
| Weighted residual factors for significantly intense reflections | 0.0776 |
| Weighted residual factors for all reflections included in the refinement | 0.0912 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.701 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1567523.html
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Users of the data should acknowledge the original authors of the
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