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Information card for entry 1567629
Preview
| Coordinates | 1567629.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C64 H66 Si2 |
|---|---|
| Calculated formula | C64 H66 Si2 |
| SMILES | c12c(ccc3c4c(cc(c(c5cc6c(cc7c(c8c(ccc9c%10c(cc(c7C#C[Si](C(C)C)(C(C)C)C(C)C)c89)cccc%10)C)c6)cc25)C#C[Si](C(C)C)(C(C)C)C(C)C)c13)cccc4)C |
| Title of publication | Isomeric Dibenzooctazethrene Diradicals for High-Performance Air-Stable Organic Field-Effect Transistors |
| Authors of publication | Zong, Chaoyang; Yang, Shuyuan; Sun, Yajing; Zhang, Lifeng; Hu, Jinlian; Hu, Wenping; Li, Rongjin; Sun, Zhe |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| a | 7.9997 ± 0.0002 Å |
| b | 8.8382 ± 0.0002 Å |
| c | 17.8954 ± 0.0003 Å |
| α | 94.227 ± 0.002° |
| β | 96.681 ± 0.002° |
| γ | 94.149 ± 0.002° |
| Cell volume | 1249.06 ± 0.05 Å3 |
| Cell temperature | 302.64 ± 0.1 K |
| Ambient diffraction temperature | 302.64 ± 0.1 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.086 |
| Residual factor for significantly intense reflections | 0.0712 |
| Weighted residual factors for significantly intense reflections | 0.2003 |
| Weighted residual factors for all reflections included in the refinement | 0.209 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1567629.html
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Users of the data should acknowledge the original authors of the
structural data.