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Information card for entry 1567808
Preview
| Coordinates | 1567808.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H72 F6 N6 O8 S2 |
|---|---|
| Calculated formula | C42 H72 F6 N6 O8 S2 |
| Title of publication | A bis-NHC–CAAC dimer derived dicationic diradical |
| Authors of publication | Nayak, Mithilesh Kumar; Sarkar, Pallavi; Elvers, Benedict J.; Mehta, Sakshi; Zhang, Fangyuan; Chrysochos, Nicolas; Krummenacher, Ivo; Vijayakanth, Thangavel; Narayanan, Ramakirushnan Suriya; Dolai, Ramapada; Roy, Biswarup; Malik, Vishal; Rawat, Hemant; Mondal, Abhishake; Boomishankar, Ramamoorthy; Pati, Swapan K.; Braunschweig, Holger; Schulzke, Carola; Ravat, Prince; Jana, Anukul |
| Journal of publication | Chemical Science |
| Year of publication | 2022 |
| Journal volume | 13 |
| Journal issue | 42 |
| Pages of publication | 12533 - 12539 |
| a | 10.2368 ± 0.0004 Å |
| b | 11.7148 ± 0.0005 Å |
| c | 20.4531 ± 0.0008 Å |
| α | 90° |
| β | 92.856 ± 0.003° |
| γ | 90° |
| Cell volume | 2449.73 ± 0.17 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0733 |
| Residual factor for significantly intense reflections | 0.0607 |
| Weighted residual factors for significantly intense reflections | 0.1634 |
| Weighted residual factors for all reflections included in the refinement | 0.1746 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1567808.html
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Users of the data should acknowledge the original authors of the
structural data.