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Information card for entry 1568435
Preview
| Coordinates | 1568435.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C57 H80 Al Cu N4 Si2 |
|---|---|
| Calculated formula | C57 H80 Al Cu N4 Si2 |
| SMILES | [Cu]1(=C2N(C(C)C)C(C)=C(N2C(C)C)C)[C]([Al]2(N([Si](C)(C)CC[Si](N2c2c(cccc2C(C)C)C(C)C)(C)C)c2c(cccc2C(C)C)C(C)C)[C]1#Cc1ccccc1)#Cc1ccccc1 |
| Title of publication | Structural snapshots of an Al-Cu bond-mediated transformation of terminal acetylenes. |
| Authors of publication | Liu, Han-Ying; Neale, Samuel E.; Hill, Michael S.; Mahon, Mary F.; McMullin, Claire L. |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 2866 - 2876 |
| a | 20.8885 ± 0.0002 Å |
| b | 13.8728 ± 0.0001 Å |
| c | 19.6118 ± 0.0002 Å |
| α | 90° |
| β | 101.347 ± 0.001° |
| γ | 90° |
| Cell volume | 5572.06 ± 0.09 Å3 |
| Cell temperature | 150 ± 0.1 K |
| Ambient diffraction temperature | 150 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.039 |
| Residual factor for significantly intense reflections | 0.0371 |
| Weighted residual factors for significantly intense reflections | 0.0903 |
| Weighted residual factors for all reflections included in the refinement | 0.0921 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1568435.html
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Users of the data should acknowledge the original authors of the
structural data.