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Information card for entry 1569586
Preview
| Coordinates | 1569586.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C183 H134 S10 |
|---|---|
| Calculated formula | C179.301 H134 S2.602 |
| Title of publication | Curved graphene nanoribbons derived from tetrahydropyrene-based polyphenylenes <i>via</i> one-pot K-region oxidation and Scholl cyclization. |
| Authors of publication | Obermann, Sebastian; Zheng, Wenhao; Melidonie, Jason; Böckmann, Steffen; Osella, Silvio; Arisnabarreta, Nicolás; Guerrero-León, L Andrés; Hennersdorf, Felix; Beljonne, David; Weigand, Jan J.; Bonn, Mischa; De Feyter, Steven; Hansen, Michael Ryan; Wang, Hai I.; Ma, Ji; Feng, Xinliang |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 32 |
| Pages of publication | 8607 - 8614 |
| a | 23.6811 ± 0.0006 Å |
| b | 28.4303 ± 0.0009 Å |
| c | 21.9446 ± 0.0004 Å |
| α | 90° |
| β | 101.217 ± 0.002° |
| γ | 90° |
| Cell volume | 14492.2 ± 0.7 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1636 |
| Residual factor for significantly intense reflections | 0.0902 |
| Weighted residual factors for significantly intense reflections | 0.2334 |
| Weighted residual factors for all reflections included in the refinement | 0.2928 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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