Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1569593
Preview
| Coordinates | 1569593.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H72 Ge4 Si10 |
|---|---|
| Calculated formula | C24 H72 Ge4 Si10 |
| SMILES | C[Si]([Ge]12[Si](C)(C)[Ge]3([Si](C)(C)[Ge]([Si]2(C)C)([Si](C)(C)[Ge]([Si]1(C)C)([Si]3(C)C)[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)(C)C |
| Title of publication | Selective synthesis of germasila-adamantanes through germanium-silicon shift processes. |
| Authors of publication | Kühn, Steffen; Köstler, Benedikt; True, Celine; Albers, Lena; Wagner, Matthias; Müller, Thomas; Marschner, Christoph |
| Journal of publication | Chemical science |
| Year of publication | 2023 |
| Journal volume | 14 |
| Journal issue | 33 |
| Pages of publication | 8956 - 8961 |
| a | 17.67 ± 0.0018 Å |
| b | 17.67 ± 0.0018 Å |
| c | 29.511 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 7980 ± 2 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.0544 |
| Residual factor for significantly intense reflections | 0.0533 |
| Weighted residual factors for significantly intense reflections | 0.1098 |
| Weighted residual factors for all reflections included in the refinement | 0.1105 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9974 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1569593.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.