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Information card for entry 1569772
Preview
| Coordinates | 1569772.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H22 Cl4 Cu2 N2 O2 Se2 |
|---|---|
| Calculated formula | C24 H22 Cl4 Cu2 N2 O2 Se2 |
| SMILES | c12cccc[n]2[Cu]2([O]3[Cu]([n]4c(cccc4)C[Se]=3c3ccccc3)([O]2=[Se](C1)c1ccccc1)(Cl)Cl)(Cl)Cl |
| Title of publication | Chalcogen bonding in copper(II)-mediated synthesis. |
| Authors of publication | Aliyeva, Vusala A.; Gurbanov, Atash V.; Mahmoud, Abdallah G.; Gomila, Rosa M.; Frontera, Antonio; Mahmudov, Kamran T.; Pombeiro, Armando J. L. |
| Journal of publication | Faraday discussions |
| Year of publication | 2023 |
| Journal volume | 244 |
| Journal issue | 0 |
| Pages of publication | 77 - 95 |
| a | 7.7872 ± 0.0002 Å |
| b | 13.1414 ± 0.0004 Å |
| c | 14.2735 ± 0.0005 Å |
| α | 90° |
| β | 100.945 ± 0.001° |
| γ | 90° |
| Cell volume | 1434.1 ± 0.08 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0252 |
| Residual factor for significantly intense reflections | 0.0184 |
| Weighted residual factors for significantly intense reflections | 0.0391 |
| Weighted residual factors for all reflections included in the refinement | 0.0411 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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