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Information card for entry 1571152
Preview
| Coordinates | 1571152.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 2a in manuscript |
|---|---|
| Formula | C26 H42 Cl2 N2 Si2 |
| Calculated formula | C26 H42 Cl2 N2 Si2 |
| SMILES | c1(nc(C#C[Si](C(C)C)(C(C)C)C(C)C)c(nc1C#C[Si](C(C)C)(C(C)C)C(C)C)Cl)Cl |
| Title of publication | Synthesis and structural properties of <i>para</i>-diselenopyrazines. |
| Authors of publication | Hüßler, Christopher; Dietl, Martin C.; Kahle, Justin; Lopes, Eric F.; Kawamura, Miku; Krämer, Petra; Rominger, Frank; Rudolph, Matthias; Hachiya, Iwao; Hashmi, A Stephen K |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2024 |
| Journal volume | 60 |
| Journal issue | 28 |
| Pages of publication | 3786 - 3789 |
| a | 10.53 ± 0.002 Å |
| b | 10.929 ± 0.002 Å |
| c | 12.931 ± 0.004 Å |
| α | 90° |
| β | 96.525 ± 0.004° |
| γ | 90° |
| Cell volume | 1478.5 ± 0.6 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | I 1 2/m 1 |
| Hall space group symbol | -I 2y |
| Residual factor for all reflections | 0.1221 |
| Residual factor for significantly intense reflections | 0.0662 |
| Weighted residual factors for significantly intense reflections | 0.1013 |
| Weighted residual factors for all reflections included in the refinement | 0.1195 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1571152.html
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Users of the data should acknowledge the original authors of the
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