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Information card for entry 1571155
Preview
| Coordinates | 1571155.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 3a in manuscript |
|---|---|
| Formula | C26 H44 N2 Se2 Si2 |
| Calculated formula | C26 H44 N2 Se2 Si2 |
| SMILES | [se]1c(cc2c1nc1cc([se]c1n2)[Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C |
| Title of publication | Synthesis and structural properties of <i>para</i>-diselenopyrazines. |
| Authors of publication | Hüßler, Christopher; Dietl, Martin C.; Kahle, Justin; Lopes, Eric F.; Kawamura, Miku; Krämer, Petra; Rominger, Frank; Rudolph, Matthias; Hachiya, Iwao; Hashmi, A Stephen K |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2024 |
| Journal volume | 60 |
| Journal issue | 28 |
| Pages of publication | 3786 - 3789 |
| a | 14.408 ± 0.0014 Å |
| b | 16.0163 ± 0.0016 Å |
| c | 12.9816 ± 0.0013 Å |
| α | 90° |
| β | 97.694 ± 0.002° |
| γ | 90° |
| Cell volume | 2968.7 ± 0.5 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1335 |
| Residual factor for significantly intense reflections | 0.0499 |
| Weighted residual factors for significantly intense reflections | 0.0794 |
| Weighted residual factors for all reflections included in the refinement | 0.0992 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.993 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1571155.html
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Users of the data should acknowledge the original authors of the
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