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Information card for entry 1571450
Preview
| Coordinates | 1571450.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H30 N4 Ni O6 |
|---|---|
| Calculated formula | C36 H30 N4 Ni O6 |
| SMILES | c12ccc3=C(c4ccc5n4[Ni]4([n]6c(=C(c7ccc5n47)c4cc(OC)c(OC)c(OC)c4)ccc26)[n]13)c1cc(OC)c(OC)c(OC)c1 |
| Title of publication | Norcorroles as antiaromatic π-electronic systems that form dimension-controlled assemblies. |
| Authors of publication | Ishikawa, Soh; Yamasumi, Kazuhisa; Sugiura, Shinya; Sato, Shunsuke; Watanabe, Go; Koo, Yun Hee; Seki, Shu; Bando, Yuya; Haketa, Yohei; Shinokubo, Hiroshi; Maeda, Hiromitsu |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 20 |
| Pages of publication | 7603 - 7609 |
| a | 19.513 ± 0.008 Å |
| b | 3.9317 ± 0.0017 Å |
| c | 18.474 ± 0.007 Å |
| α | 90° |
| β | 96.947 ± 0.015° |
| γ | 90° |
| Cell volume | 1406.9 ± 1 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1183 |
| Residual factor for significantly intense reflections | 0.0834 |
| Weighted residual factors for significantly intense reflections | 0.1605 |
| Weighted residual factors for all reflections included in the refinement | 0.1758 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.15 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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