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Information card for entry 1571678
Preview
| Coordinates | 1571678.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Cr(OSi(tBu)3)3(XyNC)2 |
|---|---|
| Formula | C54 H99 Cr N2 O12 Si3 |
| Calculated formula | C54 H99 Cr N2 O12 Si3 |
| Title of publication | Influence of strong π-acceptor ligands on Cr-K-edge X-ray absorption spectral signatures and consequences for the interpretation of surface sites in the Phillips catalyst. |
| Authors of publication | Kakiuchi, Yuya; Shapovalova, Svetlana; Protsenko, Bogdan; Guda, Sergey; Safonova, Olga V.; Guda, Alexander; Copéret, Christophe |
| Journal of publication | Catalysis science & technology |
| Year of publication | 2024 |
| Journal volume | 14 |
| Journal issue | 13 |
| Pages of publication | 3682 - 3690 |
| a | 13.1907 ± 0.0003 Å |
| b | 20.8362 ± 0.0005 Å |
| c | 23.4449 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6443.7 ± 0.3 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0854 |
| Residual factor for significantly intense reflections | 0.0835 |
| Weighted residual factors for significantly intense reflections | 0.1905 |
| Weighted residual factors for all reflections included in the refinement | 0.1915 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1571678.html
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structural data.