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Information card for entry 1572584
Preview
| Coordinates | 1572584.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H22 Cl O3 P |
|---|---|
| Calculated formula | C20 H22 Cl O3 P |
| SMILES | ClP(=O)(C(=O)c1c(cc(cc1C)C)C)C(=O)c1c(cc(cc1C)C)C |
| Title of publication | Beyond absorption maxima: the impact of wavelength-resolved photochemistry on materials science. |
| Authors of publication | Thijssen, Quinten; Carroll, Joshua A.; Feist, Florian; Beil, Andreas; Grützmacher, Hansjörg; Wegener, Martin; Van Vlierberghe, Sandra; Barner-Kowollik, Christopher |
| Journal of publication | Materials horizons |
| Year of publication | 2024 |
| Journal volume | 11 |
| Journal issue | 24 |
| Pages of publication | 6184 - 6191 |
| a | 16.2107 ± 0.0009 Å |
| b | 16.3358 ± 0.0009 Å |
| c | 7.1968 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1905.82 ± 0.18 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 5 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P c a 21 |
| Hall space group symbol | P 2c -2ac |
| Residual factor for all reflections | 0.0532 |
| Residual factor for significantly intense reflections | 0.0399 |
| Weighted residual factors for significantly intense reflections | 0.0858 |
| Weighted residual factors for all reflections included in the refinement | 0.0913 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.09 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~2,3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1572584.html
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Users of the data should acknowledge the original authors of the
structural data.