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Information card for entry 1572729
Preview
| Coordinates | 1572729.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C207 H205 Cu9 N2 Na4 O49.5 P4 Si20 |
|---|---|
| Calculated formula | C207 H205 Cu9 N2 Na4 O49.5 P4 Si20 |
| Title of publication | An ionic Cu<sub>9</sub>Na<sub>4</sub>-phenylsilsesquioxane/bis(triphenylphosphine)iminium complex: synthesis, unique structure, and catalytic activity. |
| Authors of publication | Bilyachenko, Alexey N.; Khrustalev, Victor N.; Huang, Zhibin; Dubinina, Kristina D.; Shubina, Elena S.; Lobanov, Nikolai N.; Sun, Di; Alegria, Elisabete C. B. A.; Pombeiro, Armando J. L. |
| Journal of publication | Nanoscale |
| Year of publication | 2024 |
| Journal volume | 16 |
| Journal issue | 41 |
| Pages of publication | 19266 - 19275 |
| a | 16.3354 ± 0.0009 Å |
| b | 24.6172 ± 0.0013 Å |
| c | 28.7146 ± 0.0015 Å |
| α | 75.3941 ± 0.0012° |
| β | 87.8609 ± 0.0013° |
| γ | 89.5919 ± 0.0012° |
| Cell volume | 11166.1 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1898 |
| Residual factor for significantly intense reflections | 0.1034 |
| Weighted residual factors for significantly intense reflections | 0.2066 |
| Weighted residual factors for all reflections included in the refinement | 0.2383 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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