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Information card for entry 1572733
Preview
| Coordinates | 1572733.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C62 H64 B4 N4 Se |
|---|---|
| Calculated formula | C62 H64 B4 N4 Se |
| SMILES | [Se](=C1B(N(N(B1c1c(C)cc(cc1C)C)c1ccccc1)c1ccccc1)c1c(C)cc(cc1C)C)=C1B(N(N(B1c1c(cc(cc1C)C)C)c1ccccc1)c1ccccc1)c1c(cc(cc1C)C)C |
| Title of publication | Fully conjugated tetraborylethylene: selenium mediated C-C double bond formation from diborylcarbenoid. |
| Authors of publication | Shibutani, Yuki; Kusumoto, Shuhei; Nozaki, Kyoko |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 43 |
| Pages of publication | 17912 - 17917 |
| a | 23.3386 ± 0.0007 Å |
| b | 22.7872 ± 0.0006 Å |
| c | 12.1836 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6479.5 ± 0.3 Å3 |
| Cell temperature | 93 ± 2 K |
| Ambient diffraction temperature | 93 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 21 21 2 |
| Hall space group symbol | P 2 2ab |
| Residual factor for all reflections | 0.0409 |
| Residual factor for significantly intense reflections | 0.0357 |
| Weighted residual factors for significantly intense reflections | 0.0948 |
| Weighted residual factors for all reflections included in the refinement | 0.0972 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1572733.html
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Users of the data should acknowledge the original authors of the
structural data.