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Information card for entry 1572827
Preview
| Coordinates | 1572827.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Hf6-phenylphosphinate |
|---|---|
| Formula | C73.45 H78.9 Cl2.9 Hf6 O32 P12 |
| Calculated formula | C72.2 H76.4 Cl0.4 Hf6 O32 P12 |
| Title of publication | Atomically precise surface chemistry of zirconium and hafnium metal oxo clusters beyond carboxylate ligands. |
| Authors of publication | Unniram Parambil, Ajmal Roshan; Pokratath, Rohan; Parammal, Muhammed Jibin; Dhaene, Evert; Van den Eynden, Dietger; Balog, Sandor; Prescimone, Alessandro; Infante, Ivan; Shahgaldian, Patrick; De Roo, Jonathan |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 42 |
| Pages of publication | 17380 - 17396 |
| a | 14.3934 ± 0.0003 Å |
| b | 15.1871 ± 0.0003 Å |
| c | 24.943 ± 0.0005 Å |
| α | 89.932 ± 0.002° |
| β | 99.74 ± 0.002° |
| γ | 115.133 ± 0.002° |
| Cell volume | 4849.75 ± 0.19 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0984 |
| Residual factor for significantly intense reflections | 0.0899 |
| Weighted residual factors for significantly intense reflections | 0.2276 |
| Weighted residual factors for all reflections included in the refinement | 0.2348 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.34143 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.