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Information card for entry 1573007
Preview
| Coordinates | 1573007.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H30 Cl4 N2 |
|---|---|
| Calculated formula | C42 H30 Cl4 N2 |
| SMILES | ClCCl.ClCCl.n12c3ccccc3c3c1c(c1c(c3)cccc1)c1c3ccccc3cc3c1n(c1c3cccc1)Cc1ccccc1C2 |
| Title of publication | Enhanced chiroptical activity for narrow deep-blue emission in axial chiral frameworks <i>via</i> three-dimensional interlocking. |
| Authors of publication | Mo, Xuechao; Chen, Guohao; Li, Yulan; Xiao, Biao; Chen, Xuefeng; Yin, Xiaojun; Yang, Chuluo |
| Journal of publication | Chemical science |
| Year of publication | 2024 |
| Journal volume | 15 |
| Journal issue | 42 |
| Pages of publication | 17663 - 17670 |
| a | 7.8033 ± 0.0008 Å |
| b | 11.2205 ± 0.0012 Å |
| c | 38.855 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3402 ± 0.6 Å3 |
| Cell temperature | 170 K |
| Ambient diffraction temperature | 170 K |
| Number of distinct elements | 4 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0748 |
| Residual factor for significantly intense reflections | 0.0611 |
| Weighted residual factors for significantly intense reflections | 0.1502 |
| Weighted residual factors for all reflections included in the refinement | 0.1596 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
| Diffraction radiation wavelength | 1.34139 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1573007.html
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Users of the data should acknowledge the original authors of the
structural data.