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Information card for entry 1573233
Preview
| Coordinates | 1573233.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H5 As O5 S2 W |
|---|---|
| Calculated formula | C14 H5 As O5 S2 W |
| SMILES | [W](C#[O])(C#[O])(C#[O])(C#[O])(C#[O])[As]1=c2sccc2=Cc2ccsc12 |
| Title of publication | Dithienoarsinines: stable and planar π-extended arsabenzenes. |
| Authors of publication | Sumida, Akifumi; Saeki, Akinori; Matsuo, Kyohei; Naka, Kensuke; Imoto, Hiroaki |
| Journal of publication | Chemical science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 3 |
| Pages of publication | 1126 - 1135 |
| a | 7.312 ± 0.0005 Å |
| b | 10.1653 ± 0.0008 Å |
| c | 11.2954 ± 0.0008 Å |
| α | 92.355 ± 0.006° |
| β | 106.909 ± 0.006° |
| γ | 100.48 ± 0.006° |
| Cell volume | 785.92 ± 0.1 Å3 |
| Cell temperature | 256 K |
| Ambient diffraction temperature | 256 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1186 |
| Residual factor for significantly intense reflections | 0.0985 |
| Weighted residual factors for significantly intense reflections | 0.259 |
| Weighted residual factors for all reflections included in the refinement | 0.2985 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.105 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1573233.html
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Users of the data should acknowledge the original authors of the
structural data.