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Information card for entry 1573516
Preview
| Coordinates | 1573516.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 4,4'-Ethane-1,2-diyldipyridine succinic acid |
|---|---|
| Formula | C16 H18 N2 O4 |
| Calculated formula | C16 H18 N2 O4 |
| SMILES | c1cc(ccn1)CCc1ccncc1.C(=O)(O)CCC(=O)O |
| Title of publication | Managing negative linear compressibility and thermal expansion through steric hindrance: a case study of 1,2-bis(4'-pyridyl)ethane cocrystals. |
| Authors of publication | Patyk-Kaźmierczak, Ewa; Szymańska, Kornelia; Kaźmierczak, Michał |
| Journal of publication | IUCrJ |
| Year of publication | 2025 |
| Journal volume | 12 |
| Journal issue | 1 |
| a | 16.6494 ± 0.0014 Å |
| b | 4.9069 ± 0.0004 Å |
| c | 19.3575 ± 0.0013 Å |
| α | 90° |
| β | 108.812 ± 0.009° |
| γ | 90° |
| Cell volume | 1497 ± 0.2 Å3 |
| Cell temperature | 250 ± 0.14 K |
| Ambient diffraction temperature | 250 ± 0.14 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | I 1 2/a 1 |
| Hall space group symbol | -I 2ya |
| Residual factor for all reflections | 0.0824 |
| Residual factor for significantly intense reflections | 0.0528 |
| Weighted residual factors for significantly intense reflections | 0.1372 |
| Weighted residual factors for all reflections included in the refinement | 0.1652 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1573516.html
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Users of the data should acknowledge the original authors of the
structural data.