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Information card for entry 1573875
Preview
| Coordinates | 1573875.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Zn(II)-methionine |
|---|---|
| Formula | C20 H40 N4 O8 S4 Zn2 |
| Calculated formula | C20 H40 N4 O8 S4 Zn2 |
| SMILES | [Zn]12(OC(=O)[C@@H]([NH2]2)CCSC)[NH2][C@@H](CCSC)C(O1)=[O][Zn]12(OC(=O)[C@@H]([NH2]2)CCSC)[NH2][C@@H](CCSC)C(O1)=O |
| Title of publication | Accounting for electron-beam-induced warping of molecular nanocrystals in MicroED structure determination. |
| Authors of publication | Vlahakis, Niko; Clauss, Arden; Rodriguez, Jose A. |
| Journal of publication | IUCrJ |
| Year of publication | 2025 |
| Journal volume | 12 |
| Journal issue | 2 |
| a | 9.07 ± 0.002 Å |
| b | 4.91 ± 0.0019 Å |
| c | 14.97 ± 0.003 Å |
| α | 90° |
| β | 106.94 ± 0.05° |
| γ | 90° |
| Cell volume | 637.7 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.1684 |
| Residual factor for significantly intense reflections | 0.1482 |
| Weighted residual factors for significantly intense reflections | 0.373 |
| Weighted residual factors for all reflections included in the refinement | 0.3815 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.404 |
| Diffraction radiation wavelength | 0.0251 Å |
| Diffraction radiation type | Electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1573875.html
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Users of the data should acknowledge the original authors of the
structural data.