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Information card for entry 1575266
Preview
| Coordinates | 1575266.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C56 H60 Au Cl2 N4 O10 |
|---|---|
| Calculated formula | C56 H60 Au Cl2 N4 O10 |
| Title of publication | Tuning the surface chemistry of NHC-protected Au<sub>13</sub> nanoclusters <i>via</i> a robust amide coupling procedure. |
| Authors of publication | Laluk, Andrew L. D. M.; Buschmann, Dennis A.; Takano, Shinjiro; Sullivan, Angus I.; Aminfar, Parimah; Stamplecoskie, Kevin; Tsukuda, Tatsuya; Crudden, Cathleen M. |
| Journal of publication | Chemical science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 39 |
| Pages of publication | 18278 - 18285 |
| a | 10.4502 ± 0.0003 Å |
| b | 10.814 ± 0.0004 Å |
| c | 12.2059 ± 0.0005 Å |
| α | 92.928 ± 0.001° |
| β | 108.465 ± 0.001° |
| γ | 97.633 ± 0.001° |
| Cell volume | 1290.38 ± 0.08 Å3 |
| Cell temperature | 102 ± 2 K |
| Ambient diffraction temperature | 102 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0487 |
| Residual factor for significantly intense reflections | 0.0449 |
| Weighted residual factors for significantly intense reflections | 0.0976 |
| Weighted residual factors for all reflections included in the refinement | 0.1002 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1575266.html
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Users of the data should acknowledge the original authors of the
structural data.