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Information card for entry 1575410
Preview
| Coordinates | 1575410.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C258 H202 |
|---|---|
| Calculated formula | C258 H202 |
| Title of publication | Lateral π-extended helical nanographenes with large spin polarization. |
| Authors of publication | Niu, Wenhui; Fang, Chi; Tang, Likun; Unsal, Elif; Fu, Yubin; Deka, Jitul; Liu, Fupin; Popov, Alexey A.; Wu, Fupeng; Shi, Huanhuan; Komber, Hartmut; Dianat, Arezoo; Gutierrez, Rafael; Ma, Ji; Sang, Yutao; Cuniberti, Gianaurelio; Parkin, Stuart S. P. |
| Journal of publication | Chemical science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 45 |
| Pages of publication | 21446 - 21453 |
| a | 17.52 ± 0.004 Å |
| b | 19.89 ± 0.004 Å |
| c | 34.14 ± 0.007 Å |
| α | 103.49 ± 0.03° |
| β | 94.55 ± 0.03° |
| γ | 112.42 ± 0.03° |
| Cell volume | 10505 ± 5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1765 |
| Residual factor for significantly intense reflections | 0.0908 |
| Weighted residual factors for significantly intense reflections | 0.2354 |
| Weighted residual factors for all reflections included in the refinement | 0.2873 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.936 |
| Diffraction radiation wavelength | 0.7749 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1575410.html
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Users of the data should acknowledge the original authors of the
structural data.